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Scanning Electron Microscopy (SEM) / Energy Dispersive X-ray Microanalysis (EDX)

With scanning electron microscopy (SEM), the surface of a sample can be viewed with high magnification. A finely bundled electron beam scans the surface and interactions of the electrons with the object are used to create an image. Energy dispersive X-ray spectroscopy (EDX) is a form of elemental analysis by detecting characteristic X-ray radiation of the elements comprising the sample.

Area of competence

Your contacts

Benjamin Fiedler

Dr. rer. nat.
Teamleiter Gutachten
Tel +49 7171 10407-33
Fax +49 7171 10407-50

Mailfiedler[at]ifo-gmbh.de
Benjamin Papendorf

Dr. rer. nat.
Projektleiter
Tel +49 7171 10407-54
Fax +49 7171 10407-50

MailPapendorf[at]ifo-gmbh.de