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REM / EDX analysis

A scanning electron microscope examination (SEM) can be used to highly magnify the surface of a test specimen. A fine electron beam scans the surface following a specified pattern. This process is called 'screening'. During the screening, the interaction of the electrons with the object is used to produce an image. These images are depictions of the object surface. The energy-dispersive X-ray micro analysis (EDX) is a form of electron microscopy that is used to examine the chemical composition of a test specimen.

Area of competence

Your contacts

Benjamin Fiedler

Dr. rer. nat.
Teamleiter Gutachten
Tel +49 7171 10407-33
Fax +49 7171 10407-50

Mailfiedler[at]ifo-gmbh.de
Benjamin Papendorf

Dr. rer. nat.
Projektleiter
Tel +49 7171 10407-54
Fax +49 7171 10407-50

MailPapendorf[at]ifo-gmbh.de